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Measurement of silicon nanoparticle concentration using quartz crystal microgravimetry
- Reipa, V.;
- Choi, Jonghoon
SCOPUS
0초록
Various nano-scale items (nanoparticles, nanotubes, etc.) are actively investigated due to their unique physico-chemical properties. A common issue, encountered in such studies is accurate nanoparticle concentration expression, given the critical importance of the dose-response relationships. We present here the application of quartz crystal microgravimetry (QCM) to accurately measure Si nanoparticle concentration in a colloidal suspension. The QCM demonstrated a linear response for Si nanoparticle concentrations from 5 to 500 μg/m1. Our concentration estimates are compared with measurements derived from the TEM image analysis and optical absorbance. QCM concentration data was used to determine Si nanocrystal extinction coefficients for size selected samples. © The Electrochemical Society.
키워드
- 제목
- Measurement of silicon nanoparticle concentration using quartz crystal microgravimetry
- 저자
- Reipa, V.; Choi, Jonghoon
- 발행일
- 2009
- 유형
- Conference Paper
- 저널명
- ECS Transactions
- 권
- 25
- 호
- 9
- 페이지
- 167 ~ 175
- 언어
- ENG
- 발행국가
- 미국
- 분량
- 9 페이지
- ISSN
- E 1938-6737
P 1938-5862