Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application

Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application
  • Tae-Woong Jeong
  • Yun-Jae Oh
  • Seo-Yeon Chun
  • Dae Hwan Kim
  • Lee, Woo Joo
  • 외 1명
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초록

In this study, we propose a silicon-based metal oxide semiconductor field effect transistor (MOSFET) device for p-type that can operate at a high temperature (at 573 K). This device can be applied to logic circuits, and furthermore, used in semiconductor chips operating in high temperature environments. Through research, we selected 3C-SiC, which can prevent off-current most effectively, as a material to be applied to the device. After that, technology computer aided design (TCAD) simulation will be used to apply the interface characteristics according to the physical properties of silicon and 3C-SiC, and to optimize the current characteristics of device as a logic element. In addition, we investigated a complementary metal oxide semiconductor (CMOS) logic circuit with simulation program with integrated circuit emphasis (SPICE) and verify the inverting characteristics in a high temperature environment of 573 K by applying the device of this study.

키워드

Field effect transistorhigh temperature operationCMOS logicENVIRONMENTTECHNOLOGYDEPENDENCEMOSFETS
제목
Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application
제목 (타언어)
Investigation of p-type High Temperature Field Effect Transistor for CMOS Logic Application
저자
Tae-Woong JeongYun-Jae OhSeo-Yeon ChunDae Hwan KimLee, Woo JooIl Hwan Cho
DOI
10.5573/JSTS.2022.22.5.376
발행일
2022-10
유형
Article
저널명
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
22
5
페이지
376 ~ 385