ScholarWorks@중앙대학교

초록

This brief presents the on-chip background offset and timing-skew calibration of the 1-then-2b/cycle time-interleaved successive-approximation-register analog-to-digital converter (TI SAR ADC). For timing-skew between sub-ADC's sampling clocks, a comparator offset-based window detector (WD) is used to adjust the clock edge misalignment. In addition, comparator offset calibration is considered both in terms of 1) global offset (between the offset-free reference comparator and the local reference comparator in each sub-ADC) and 2) local offset (between the local reference comparator and the rest of the comparators in the same sub-ADC). The proposed calibration sufficiently suppresses noise floor and spurs, and all calibrations are performed in the background without interfering with normal ADC operation. The prototype 5-way TI SAR ADC is fabricated in a 28 nm CMOS process and occupies a 0.03 mm(2) area including on-chip calibration. With the proposed calibration, the prototype achieves SNDR of 40 dB at Nyquist input and consumes 7.57 mW, leading to the Walden figure of merit (FoM(W)) of 37.2 fJ/conversion-step.

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