상세 보기
All solution-processed high-resolution bottom-contact transparent metal-oxide thin film transistors
- Park, Sung Kyu;
- Kim, Yong-Hoon;
- Han, Jeong-In
WEB OF SCIENCE
55SCOPUS
58초록
We report all solution-processed high-resolution bottom-contact indium-gallium-zinc-oxide (IGZO) thin film transistors (TFTs) using a simple surface patterning and dip-casting process. High-resolution nanoparticulate Ag source/drain electrodes and a sol-gel processed IGZO semiconductor were deposited by a simple dip-casting along with a photoresist-free, non-relief-pattern lithographic process. The deposited Ag and IGZO solution can be steered into the desired hydrophilic areas by a low surface energy self-assembled monolayer, resulting in source/drain electrodes and semiconducting layer, respectively. The all solution-processed bottom-contact IGZO TFTs including a channel length of 10 mu m typically showed a mobility range 0.05-0.2 cm(2) V-1 s(-1) with an on/off ratio of more than 10(6).
키워드
- 제목
- All solution-processed high-resolution bottom-contact transparent metal-oxide thin film transistors
- 저자
- Park, Sung Kyu; Kim, Yong-Hoon; Han, Jeong-In
- 발행일
- 2009-06
- 유형
- Article
- 권
- 42
- 호
- 12
- 언어
- ENG
- 출판사
- IOP PUBLISHING LTD
- 발행국가
- 영국
- ISSN
- E 1361-6463
P 0022-3727