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Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction
- O'Malley, S. M.;
- Bonanno, P. L.;
- Ahn, K. H.;
- Sirenko, A. A.;
- Kazimirov, A.;
- ... Park, S.;
- 외 4명
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6초록
The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.
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TRANSFORMATION
- 제목
- Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction
- 저자
- O'Malley, S. M.; Bonanno, P. L.; Ahn, K. H.; Sirenko, A. A.; Kazimirov, A.; Tanimura, M.; Asada, T.; Park, S.; Horibe, Y.; Cheong, S-W.
- 발행일
- 2008-10
- 유형
- Article
- 권
- 78
- 호
- 16
- 언어
- ENG
- 출판사
- AMER PHYSICAL SOC
- 발행국가
- 미국
- ISSN
- E 2469-9969
P 2469-9950