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Noise-driven multistability in a plasma diode
- Seo, J.T.;
- Pae, K.H.;
- Hahn, S.J.
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7초록
Recently, a brand-new phenomenon of competing multistability in plasma diode systems has been observed by our group [S. J. Hahn and K. H. Pae, Phys. Plasmas 10, 314 (2003)]. By employing one-dimensional particle-in-cell simulations with proper control of the inherent numerical noise, the noise-driven multistability and dynamical transitions between regular and multistable solutions have been investigated. Throughout this work, it is verified that the competing multistability is, in principle, a noise-driven dynamical switch between attractors and occurs due to noise fluctuations inside a system near the fractal basin boundaries. (C) 2004 American Institute of Physics.
키워드
DELAYED RECURRENT LOOPS; COEXISTING ATTRACTORS; FILLED DIODES; PIERCE DIODE; CHAOS; OSCILLATIONS; SIMULATION; CIRCUIT; LASER
- 제목
- Noise-driven multistability in a plasma diode
- 저자
- Seo, J.T.; Pae, K.H.; Hahn, S.J.
- 발행일
- 2004-11
- 유형
- Article
- 권
- 11
- 호
- 11
- 페이지
- 5364 ~ 5367