다중 레이블 나이브 베이즈 분류를 위한 새로운 사후확률 추정 방법에 관한 연구

초록

A multi-label classification is to find multiple labels associated with the input pattern. Multi-label classification can be achieved by extending conventional single-label classification. Common extension techniques are known as Binary relevance, Label powerset, and Classifier chains. However, most of the extended multi-label naive bayes classifier has not been able to accurately estimate posterior probabilities because it does not reflect the label dependency. And the remaining extended multi-label naive bayes classifier has a problem that it is unstable to estimate posterior probability according to the label selection order. To estimate posterior probability well, we propose a new posterior probability estimation method that reflects the probability between all labels and labels efficiently. The proposed method reflects the correlation between labels. And we have confirmed through experiments that the extended multi-label naive bayes classifier using the proposed method has higher accuracy then the existing multi-label naive bayes classifiers.

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