Characteristics of Pulse-Reverse Electrodeposited Cu Thin Film II. Effects of Organic Additives
  • Kim, Myung Jun
  • Lim, Taeho
  • Park, Kyung Ju
  • Kwon, Oh Joong
  • Kim, Soo-Kil
  • 외 1명
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초록

Pulse-reverse electrodeposition is capable of improving the superfilling ability and other properties of Cu in device interconnections. In this research, the influences of pulse-reverse electrodeposition on the properties of Cu thin film were investigated in the presence of organic additives used for Cu superfilling. The anodic step of pulse-reverse electrodeposition gave rise to changes in crystallinity, resistivity, grain size, and surface roughness. Minimum resistivity at the optimum dissolution ratio was observed, revealing a 14% reduction of the resistivity as compared to pulse electrodeposition samples. This was ascribed to the minimization of surface roughness produced by the selective dissolution of SPS-covered Cu as opposed to PEG-Cl--covered Cu. It was confirmed that the selectivity of the anodic step came from the adsorbates and the anodic potential, resulting in changes in the film properties. (C) 2012 The Electrochemical Society. [DOI: 10.1149/2.046209jes] All rights reserved.

키워드

GRAIN-BOUNDARY CONTRIBUTIONSELECTRICAL-RESISTIVITYSUPERCONFORMAL ELECTRODEPOSITIONCOPPER ELECTRODEPOSITIONPEGSIZEMODELSPSCLACCELERATOR
제목
Characteristics of Pulse-Reverse Electrodeposited Cu Thin Film II. Effects of Organic Additives
저자
Kim, Myung JunLim, TaehoPark, Kyung JuKwon, Oh JoongKim, Soo-KilKim, Jae Jeong
DOI
10.1149/2.046209jes
발행일
2012-09
유형
Article
저널명
Journal of the Electrochemical Society
159
9
페이지
D544 ~ D548