Scanning low-temperature element-specific magnetic microscopy

Cady, A.; Haskel, Daniel; Lang, Jonathan C.; Srajer, George; Chupas, Peter J.; Osborn, Raymond; Mitchell, J.F.; Ahn, Jai-seok; Hur, N.; Park, Soonyong; Cheong, Sang-Wook

doi:10.1063/1.1921510

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Scanning low-temperature element-specific magnetic microscopy

Cady, A.;
Haskel, Daniel;
Lang, Jonathan C.;
Srajer, George;
Chupas, Peter J.;
... Park, Soonyong;
외 5명

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5

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5

초록

We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with similar to 1 mu m(2) resolution at low temperature (> 10 K) under a moderate applied field (< 0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems. (c) 2005 American Institute of Physics.

키워드

LAYERED MANGANITES; X-RAYS; PHASE; LA1.2SR1.8MN2O7

제목: Scanning low-temperature element-specific magnetic microscopy

저자: Cady, A.; Haskel, Daniel; Lang, Jonathan C.; Srajer, George; Chupas, Peter J.; Osborn, Raymond; Mitchell, J.F.; Ahn, Jai-seok; Hur, N.; Park, Soonyong; Cheong, Sang-Wook

DOI: 10.1063/1.1921510

발행일: 2005-06

유형: Article

저널명: Review of Scientific Instruments

권: 76

호: 6