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Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment
- Kim, Y.;
- Yi, S.;
- Ahn, H.;
- Hong, C.-H.
WEB OF SCIENCE
9SCOPUS
13초록
Defects or cracks in roads, building walls, floors, and product surfaces can degrade the completeness of the product and become an impediment to quality control. Machine learning can be a solution for detecting defects effectively without human experts; however, the low-power computing device cannot afford that. In this paper, we suggest a crack detection system accelerated by edge computing. Our system consists of two: Rsef and Rsef-Edge. Rsef is a real-time segmentation method based on effective feature extraction that can perform crack image segmentation by optimizing conventional deep learning models. Then, we construct the edge-based system, named Rsef-Edge, to significantly decrease the inference time of Rsef, even in low-power IoT devices. As a result, we show both a fast inference time and good accuracy even in a low-powered computing environment. © 2023 by the authors.
키워드
- 제목
- Accurate Crack Detection Based on Distributed Deep Learning for IoT Environment
- 저자
- Kim, Y.; Yi, S.; Ahn, H.; Hong, C.-H.
- 발행일
- 2023-01
- 유형
- Article
- 저널명
- Sensors
- 권
- 23
- 호
- 2
- 언어
- ENG
- 출판사
- MDPI
- 발행국가
- 스위스
- ISSN
- E 1424-3210
P 1424-8220