Quantitative temperature profiling through null-point scanning thermal microscopy

Chung, J.; Kim, K.; Hwang, G.; Kwon, O.; Choi, Y. K.; Lee, J. S.

doi:10.1016/j.ijthermalsci.2011.11.012

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Quantitative temperature profiling through null-point scanning thermal microscopy

Chung, J.;
Kim, K.;
Hwang, G.;
Kwon, O.;
Choi, Y. K.;
외 1명

Citations

WEB OF SCIENCE

36

Citations

SCOPUS

37

초록

We develop and demonstrate the theory and method of null-point scanning thermal microscopy, which can obtain quantitative temperature profiles even when the heat conductance between the tip and the sample is disturbed due to abrupt changes in the surface topography or properties. Due to its generality, it would be widely applicable for a variety of problems associated with the thermal characterization of nanomaterials and nanodevices. (C) 2011 Elsevier Masson SAS. All rights reserved.

키워드

Scanning thermal microscopy (SThM); Null-point method; Quantitative temperature profiling; Nanoscale thermal measurement; Thermometry; Thermal conductance; ENERGY-DISSIPATION; TRANSISTORS; TRANSPORT; DEVICES

제목: Quantitative temperature profiling through null-point scanning thermal microscopy

저자: Chung, J.; Kim, K.; Hwang, G.; Kwon, O.; Choi, Y. K.; Lee, J. S.

DOI: 10.1016/j.ijthermalsci.2011.11.012

발행일: 2012-12

유형: Article

저널명: International Journal of Thermal Sciences

권: 62

페이지: 109 ~ 113