Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy

  • Choi, Dukhyun; 
  • Jeon, Jihoon; 
  • Lee, Pyungsoo; 
  • Hwang, Woonbong; 
  • Lee, Kunhong; 
  • 외 1명
Citations

WEB OF SCIENCE

12
Citations

SCOPUS

13

초록

This paper determines the Young's modulus of nanohoneycomb structures by flexural testing in an atomic force microscope (AFM). Since the cross-sectional area of nanohoneycomb structures varies along the structure, the area moment of inertia is not a constant. The area moment of inertia is also influenced by the porosity of the nanohoneycomb structure. An anodic aluminum oxide (AAO) film is fabricated as a nanohoneycomb structure. Young's modulus of the AAO film, measured from the results of flexural testing in AFM, is in good agreement with the results of tensile tests in a Nano-UTM (universal testing machine).

키워드

AFM; Nano-UTM; Nanohoneycomb structure; Young's modulus; SINGLE-CRYSTAL SILICON; MECHANICAL-PROPERTIES; BENDING TEST; INTERMEDIATE TEMPERATURES; NANOSCALE STRUCTURES; NANOWIRE ARRAYS; THIN-FILMS; AFM; ALUMINUM; WIRE
제목
Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy
저자
Choi, Dukhyun; Jeon, Jihoon; Lee, Pyungsoo; Hwang, Woonbong; Lee, Kunhong; Park, Hyunchul
DOI
10.1016/j.compstruct.2006.02.023
발행일
2007-08
유형
Article
저널명
Composite Structures
권
79
호
4
페이지
548 ~ 553