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Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy
- Choi, Dukhyun;
- Jeon, Jihoon;
- Lee, Pyungsoo;
- Hwang, Woonbong;
- Lee, Kunhong;
- 외 1명
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13초록
This paper determines the Young's modulus of nanohoneycomb structures by flexural testing in an atomic force microscope (AFM). Since the cross-sectional area of nanohoneycomb structures varies along the structure, the area moment of inertia is not a constant. The area moment of inertia is also influenced by the porosity of the nanohoneycomb structure. An anodic aluminum oxide (AAO) film is fabricated as a nanohoneycomb structure. Young's modulus of the AAO film, measured from the results of flexural testing in AFM, is in good agreement with the results of tensile tests in a Nano-UTM (universal testing machine).
키워드
AFM; Nano-UTM; Nanohoneycomb structure; Young's modulus; SINGLE-CRYSTAL SILICON; MECHANICAL-PROPERTIES; BENDING TEST; INTERMEDIATE TEMPERATURES; NANOSCALE STRUCTURES; NANOWIRE ARRAYS; THIN-FILMS; AFM; ALUMINUM; WIRE
- 제목
- Young's modulus measurements of nanohoneycomb structures by flexural testing in atomic force microscopy
- 저자
- Choi, Dukhyun; Jeon, Jihoon; Lee, Pyungsoo; Hwang, Woonbong; Lee, Kunhong; Park, Hyunchul
- 발행일
- 2007-08
- 유형
- Article
- 권
- 79
- 호
- 4
- 페이지
- 548 ~ 553
- 언어
- ENG
- 출판사
- ELSEVIER SCI LTD
- 발행국가
- 영국
- 분량
- 6 페이지
- ISSN
- E 1879-1085
P 0263-8223