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Identification of Markers Associated With Development of Stroke in “Clinically Low-Risk” Atrial Fibrillation Patients
- Shin, S.Y.;
- Han, S.-J.;
- Kim, J.-S.;
- Im, S.I.;
- Shim, J.;
- ... Lim, H.E.;
- 외 5명
WEB OF SCIENCE
33SCOPUS
31초록
Background: Stroke and thromboembolic events may still occur in “clinically low-risk” atrial fibrillation (AF) patients as categorized by CHA2DS2-VASc score. Our aim was to assess the proportion of “clinically low-risk” patients using a nongender CHA2DS2-VASc (ie, CHA2DS2-VA) score of 0 to 1 among patients who experienced AF-associated stroke and to identify markers associated with stroke in “clinically low-risk” patients. Methods and Results: We retrospectively recruited nonvalvular AF patients who experienced embolic stroke between 2013 and 2016 from 9 institutes in Korea. AF patients with CHA2DS2-VA score of 0 to 1 at the time of stroke were analyzed and compared with “clinically low-risk” AF patients without stroke. A total of 3033 subjects with AF-associated stroke were recruited. Of these, 583 patients (19.2%) had CHA2DS2-VA score of 0 to 1. On multivariate analysis, age (≥60 years), N-terminal pro B-type natriuretic peptide (≥300 pg/mL), creatinine clearance (<50 mL/min), and left atrial dimension (≥45 mm) were independently associated with stroke. With the combined application of these 4 factors (collectively, ABCD score) to the “clinically low-risk” patients, the c‐index was 0.858 (95% CI 0.838–0.877; P<0.001). Conclusions: The present study suggests a new insight into how additional use of markers can further refine stroke risk differentiation among AF patients initially classified as “clinically low-risk.”
키워드
- 제목
- Identification of Markers Associated With Development of Stroke in “Clinically Low-Risk” Atrial Fibrillation Patients
- 저자
- Shin, S.Y.; Han, S.-J.; Kim, J.-S.; Im, S.I.; Shim, J.; Ahn, J.; Lee, E.M.; Park, Y.M.; Kim, J.H.; Lip, G.Y.H.; Lim, H.E.
- 발행일
- 2019-11
- 유형
- Article
- 권
- 8
- 호
- 21
- 언어
- ENG
- 출판사
- American Heart Association Inc.
- 발행국가
- 영국
- ISSN
- E 2047-9980