Electrode dependence of resistance switching in NiO thin films

  • Kim, D.-W.; 
  • Shin, D.S.; 
  • Chang, S.H.; 
  • Park, B.H.; 
  • Jung, R.; 
  • 외 4명
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초록

We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, An and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-voltage (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures axe nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.

키워드

resistance switching; NiO; current-voltage measurement
제목
Electrode dependence of resistance switching in NiO thin films
저자
Kim, D.-W.; Shin, D.S.; Chang, S.H.; Park, B.H.; Jung, R.; Li, X.S.; Kim, D.C.; Lee, C.-W.; Seo, S.
DOI
10.3938/jkps.51.88
발행일
2007-10
유형
Article; Proceedings Paper
저널명
Journal of the Korean Physical Society
권
51
호
suppl.2
페이지
S88 ~ S91