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Electrode dependence of resistance switching in NiO thin films
- Kim, D.-W.;
- Shin, D.S.;
- Chang, S.H.;
- Park, B.H.;
- Jung, R.;
- 외 4명
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8초록
We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, An and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-voltage (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures axe nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.
키워드
resistance switching; NiO; current-voltage measurement
- 제목
- Electrode dependence of resistance switching in NiO thin films
- 저자
- Kim, D.-W.; Shin, D.S.; Chang, S.H.; Park, B.H.; Jung, R.; Li, X.S.; Kim, D.C.; Lee, C.-W.; Seo, S.
- 발행일
- 2007-10
- 유형
- Article; Proceedings Paper
- 권
- 51
- 호
- suppl.2
- 페이지
- S88 ~ S91
- 언어
- ENG
- 출판사
- KOREAN PHYSICAL SOC
- 발행국가
- 대한민국
- ISSN
- E 1976-8524
P 0374-4884