Temperature dependence of the critical points of monolayer MoS2 by ellipsometry

  • Park, Han Gyeol; 
  • Kim, Tae Jung; 
  • Kim, Hwa Seob; 
  • Yoo, Chang Hyun; 
  • Barange, Nilesh S.; 
  • ... Seong, Maeng-Je; 
  • 외 6명
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35
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38

초록

We report the complex pseudodielectric function < epsilon > = < epsilon(1) > + i < epsilon(2) > of molybdenum disulfide (MoS2) monolayers for energies from 1.40 to 6.42 eV and temperatures from 35 to 350 K. MoS2 was grown as a continuous monolayer on a SiO2/Si substrate in a two zone hot-wall furnace using a catalyst-free chemical vapor growth process. The monolayer was then transferred onto a sapphire substrate. We investigated the optical properties of MoS2 using a dual-rotating-compensator ellipsometer with the sample in ultrahigh vacuum to prevent degradation and to minimize condensation artifacts in the data at low sample temperatures. Critical-point (CP) energies were determined using numerically calculated second energy derivatives of the spectra. At low temperature, we observed a splitting of A-excitonic peak. This identifies the bound excitonic states, including negatively charged excitons, trion states in monolayer MoS2. Splitting of the B-excitonic peak is also indicated. Blue shifts of the CP energies and enhanced structures with reduced electron-phonon interaction are observed as the temperature is lowered. The temperature dependences of the CP energies were fit to a phenomenological expression that contains the Bose-Einstein statistical factor and the temperature coefficient.

키워드

Molybdenum disulfide (MoS2); ellipsometry; dielectric function; temperature dependence; critical point; CHEMICAL-VAPOR-DEPOSITION; SINGLE-LAYER MOS2; MOLYBDENUM-DISULFIDE; OPTICAL-PROPERTIES; ATOMIC LAYERS; THIN-FILMS; GROWTH; TRANSISTORS; UNIFORM
제목
Temperature dependence of the critical points of monolayer MoS2 by ellipsometry
저자
Park, Han Gyeol; Kim, Tae Jung; Kim, Hwa Seob; Yoo, Chang Hyun; Barange, Nilesh S.; Le, Van Long; Kim, Hyoung Uk; Senthilkumar, Velusamy; Le, Chinh Tam; Kim, Yong Soo; Seong, Maeng-Je; Kim, Young Dong
DOI
10.1080/05704928.2016.1166436
발행일
2016
유형
Review
저널명
Applied Spectroscopy Reviews
권
51
호
7-9
페이지
621 ~ 635