Predictability of reset switching voltages in unipolar resistance switching

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초록

In unipolar resistance switching of NiO capacitors, Joule heating in the conducting channels should cause a strong nonlinearity in the low resistance state current-voltage (I-V) curves. Due to the percolating nature of the conducting channels, the reset current I-R can be scaled to the nonlinear coefficient B-o of the I-V curves, i.e., I-R proportional to B-o(-x). This scaling relationship can be used to predict reset voltages, independent of NiO capacitor size; it can also be applied to TiO2 and FeOy capacitors. Using this relation, we developed an error correction scheme to provide a clear window for separating reset and set voltages in memory operations.

키워드

capacitors; nickel compounds; SEMICONTINUOUS METAL-FILMS; ELECTRICAL BREAKDOWN; MEMORY; MODEL
제목
Predictability of reset switching voltages in unipolar resistance switching
저자
Lee, S. B.; Chae, S. C.; Chang, S. H.; Noh, T. W.
DOI
10.1063/1.3126019
발행일
2009-04
유형
Article
저널명
Applied Physics Letters
권
94
호
17

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