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Predictability of reset switching voltages in unipolar resistance switching
- Lee, S. B.;
- Chae, S. C.;
- Chang, S. H.;
- Noh, T. W.
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37초록
In unipolar resistance switching of NiO capacitors, Joule heating in the conducting channels should cause a strong nonlinearity in the low resistance state current-voltage (I-V) curves. Due to the percolating nature of the conducting channels, the reset current I-R can be scaled to the nonlinear coefficient B-o of the I-V curves, i.e., I-R proportional to B-o(-x). This scaling relationship can be used to predict reset voltages, independent of NiO capacitor size; it can also be applied to TiO2 and FeOy capacitors. Using this relation, we developed an error correction scheme to provide a clear window for separating reset and set voltages in memory operations.
키워드
capacitors; nickel compounds; SEMICONTINUOUS METAL-FILMS; ELECTRICAL BREAKDOWN; MEMORY; MODEL
- 제목
- Predictability of reset switching voltages in unipolar resistance switching
- 저자
- Lee, S. B.; Chae, S. C.; Chang, S. H.; Noh, T. W.
- 발행일
- 2009-04
- 유형
- Article
- 권
- 94
- 호
- 17
- 언어
- ENG
- 출판사
- AMER INST PHYSICS
- 발행국가
- 미국
- ISSN
- E 1077-3118
P 0003-6951