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Effect of Thickness of Single-Phase Antimony and Tellurium Thin Films on Their Thermal Conductivities
- Park, No-Won;
- Park, Sang-In;
- Lee, Sang-Kwon
WEB OF SCIENCE
9SCOPUS
9초록
We present the effects of film thickness and grain size on the out-of-plane thermal conductivities of single-phase Sb and Te thin films, which are of great interest for thermoelectric device applications. The thermal conductivities of the films were measured by the four-point-probe 3 omega method, at room temperature. For this study, 50-, 100-, and 200-nm-thick Sb and Te thin films were prepared by electron-beam evaporation at room temperature. From the measured thermal conductivities, we evaluated that the average thermal conductivities of the Sb and Te thin films were 5.9-10.2 W/(m.K) and 0.8-1.2 W/(m.K), respectively, at room temperature. This result reveals that the thickness and grain size of each thin film strongly affect the modulation of its thermal conductivity at room temperature.
키워드
- 제목
- Effect of Thickness of Single-Phase Antimony and Tellurium Thin Films on Their Thermal Conductivities
- 저자
- Park, No-Won; Park, Sang-In; Lee, Sang-Kwon
- 발행일
- 2015-09
- 유형
- Article
- 권
- 15
- 호
- 9
- 페이지
- 6729 ~ 6733
- 언어
- ENG
- 출판사
- AMER SCIENTIFIC PUBLISHERS
- 발행국가
- 미국
- 분량
- 5 페이지
- ISSN
- E 1533-4899
P 1533-4880