Effects of electrode polarity on filament ruptures during unipolar resistance switchings

  • Jo, Jay Hyun; 
  • Lee, Shin Buhm; 
  • Lee, Jonathan Hanjin; 
  • Chang, Seo Hyoung; 
  • Chae, Seung Chul; 
  • 외 1명
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초록

It has been argued that in unipolar resistance switching of Pt/TiO2/Pt capacitors, conducting filaments should propagate from the cathode interface, and the rupture and recovery of the filaments should occur near the anode interface [Kim et al., Appl. Phys. Lett. 91 (2007) 012907]. We investigated whether this "anode-interface localized filamentary mechanism" holds for Pt/NiO/Pt capacitors. We examined how the electrode polarity affects the rupturing of the conducting filaments in unipolar resistance switching by performing resistance switching measurements on 246 NiO capacitors. We found some dependencies on electrode polarity; however, they were not consistent with the anode-interface localized filamentary mechanism. We also found that Joule heating affects the rupturing process, suggesting that the weakest link of conducting filaments in NiO thin films plays an important role during the rupturing process. (c) 2009 Elsevier B.V. All rights reserved.

키워드

Unipolar resistance switching; Filamentary model; Joule heating effects; MEMORIES; FILMS
제목
Effects of electrode polarity on filament ruptures during unipolar resistance switchings
저자
Jo, Jay Hyun; Lee, Shin Buhm; Lee, Jonathan Hanjin; Chang, Seo Hyoung; Chae, Seung Chul; Jung, Chang Uk
DOI
10.1016/j.cap.2009.09.021
발행일
2010-05
유형
Article
저널명
Current Applied Physics
권
10
호
3
페이지
817 ~ 820