Sensitivity of triangular resonator with long evanescent field around critical angle

Kim, D. G.; Oh, G. Y.; Kim, H. J.; Kim, S. H.; Ki, H. C.; Ko, H. J.; Han, M. S.; Hann, S.; Kim, T. U.; Lim, J. W.; Kim, H. J.; Choi, Y. W.

doi:10.1049/el.2010.3536

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Sensitivity of triangular resonator with long evanescent field around critical angle

Kim, D. G.;
Oh, G. Y.;
Kim, H. J.;
Kim, S. H.;
Ki, H. C.;
... Choi, Y. W.;
외 6명

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초록

A novel triangular resonator with a long evanescent field around the critical angle has been analysed and demonstrated for the first time. The sensitivity of the resonance shift used for changing the refractive index of 1 x 10(-5) at the incidence angle of 18 degrees is 1.04 x 10(-7) nm/RIU for transverse magnetic polarised light. An extinction ratio of 6 dB was observed near 1550 nm, where the incidence angle of the total internal reflection mirror inside the resonator was 18 degrees.

키워드

MICRORING RESONATORS

제목: Sensitivity of triangular resonator with long evanescent field around critical angle

저자: Kim, D. G.; Oh, G. Y.; Kim, H. J.; Kim, S. H.; Ki, H. C.; Ko, H. J.; Han, M. S.; Hann, S.; Kim, T. U.; Lim, J. W.; Kim, H. J.; Choi, Y. W.

DOI: 10.1049/el.2010.3536

발행일: 2010-04

유형: Article

저널명: Electronics Letters

권: 46

호: 7

페이지: 527 ~ R3

언어: ENG

출판사: INST ENGINEERING TECHNOLOGY-IET

발행국가: 영국

ISSN: E 1350-911X
P 0013-5194