Design of a scanning tunneling microscope integrated with a glove box for measuring two-dimensional material flakes

초록

Two-dimensional (2D) materials and their heterostructures offer a rich platform for studying the fundamentals of condensed matter physics and engineering new functional devices. Scanning tunneling microscopy (STM) has revealed various atomic structures and electronic properties of 2D materials. However, STM measurements require atomically clean surfaces, which are difficult to maintain, as many 2D materials readily degrade upon air exposure. Moreover, the small size of exfoliated flakes, typically around 10 mu m, presents a challenge for accurate and repeatable tip positioning in conventional STM systems. To overcome these limitations, we designed a home-built low-temperature STM integrated with a glove box and a specially designed sample stage. The glove box, directly connected to a load-lock chamber of STM system, enables the transfer and measurement of samples without exposure to ambient air, minimizing contamination and oxidation. The sample stage, designed with dual pockets and micron-level positioning capability, facilitate in-situ tip conditioning and precise navigation to small 2D flakes. The synergistic integration of these components ensures reliable, high-resolution STM/STS measurements, enabling comprehensive investigations into the electronic properties of a wide range of 2D materials.

키워드