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자료 필터
자료유형
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2008 ~ 2026
2008 2026
키워드
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전체 172건 중 31번부터 40번까지의 결과를 표시합니다.
2021
Article
Quantitative analysis of positive-bias-stress-induced electron trapping in the gate insulator in the self-aligned top gate coplanar indium–gallium–zinc oxide thin-film transistors
- Kim, D.-H. ;
- Jeong, H.-S. ;
- Lee, D.-H. ;
- Bae, K.-H. ;
- Lee, S. ;
- ... Kwon, Hyuck-In ;
- 외 2명
- 2021-10
- Coatings
- MDPI
Article
Comparative study on the separate extraction of interface and bulk trap densities in indium gallium zinc oxide thin-film transistors using capacitance–voltage and current–voltage characteristics
- Lee, D.-H. ;
- Kim, D.-H. ;
- Jeong, H.-S. ;
- Hwang, S.-H. ;
- Lee, S. ;
- ... Kwon, Hyuck -In ;
- 외 2명
- 2021-09
- Coatings
- MDPI
Article
Effects of oxygen content on operational characteristics and stability of high-mobility igto thin-film transistors during channel layer deposition
- Jeong, H.-S. ;
- Cha, H.-S. ;
- Hwang, S.-H. ;
- Lee, D.-H. ;
- Song, Sang-Hun ;
- ... Kwon, Hyuck-In
- 2021-06
- Coatings
- MDPI AG
Article
Effects of active layer thickness on the electrical characteristics and stability of high‐mobility amorphous indium–gallium–tin oxide thin‐film transistors
- Kim, D.-H. ;
- Cha, H.-S. ;
- Jeong, H.-S. ;
- Hwang, S.-H. ;
- Kwon, Hyuck-In
- 2021-06
- Electronics (Switzerland)
- MDPI AG
Article
Effect of Silicon Doping on the Electrical Performance of Amorphous SiInZnO Thin-film Transistors (vol 22, pg 133, 2021)
- Lee, Byeong Hyeon ;
- Kim, Dae-Hwan ;
- Lee, Doo-Yong ;
- Park, Sungkyun ;
- Kim, Sangsig ;
- ... Kwon, Hyuck-In ;
- 외 1명
- 2021-06
- Transactions on Electrical and Electronic Materials
- SPRINGER
Article
Effect of Silicon Doping on the Electrical Performance of Amorphous SiInZnO Thin-film Transistors
- Lee, Byeong Hyeon ;
- Kim, Dae-Hwan ;
- Lee, Doo-Yong ;
- Park, Sungkyun ;
- Kim, Sangsig ;
- ... Kwon, Hyuck-In ;
- 외 1명
- 2021-04
- Transactions on Electrical and Electronic Materials
- SPRINGER
Article
Effects of proton beam irradiation on the physical and chemical properties of IGTO thin films with different thicknesses for thin-film transistor applications
- Shin, M.-G. ;
- Hwang, S.-H. ;
- Cha, H.-S. ;
- Jeong, H.-S. ;
- Kim, D.-H. ;
- ... Kwon, Hyuck-In
- 2021-04
- Surfaces and Interfaces
- Elsevier B.V.
2020
Article
Electrical Performance and Stability Improvement of p-Channel SnO Thin-Film Transistors Using Atomic-Layer-Deposited Al2O3 Capping Layer
- Bae, K.-H. ;
- Shin, M.G. ;
- Hwang, S.-H. ;
- Jeong, H.-S. ;
- Kim, D.-H. ;
- ... Kwon, Hyuck-In
- 2020-12
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Electrical Performance and Stability Improvements of High-Mobility Indium-Gallium-Tin Oxide Thin-Film Transistors Using an Oxidized Aluminum Capping Layer of Optimal Thickness
- Cha, Hyun-Seok ;
- Jeong, Hwan-Seok ;
- Hwang, Seong-Hyun ;
- Lee, Dong-Ho ;
- Kwon, Hyuck-In
- 2020-12
- ELECTRONICS
- MDPI
Article
Effects of Annealing Atmosphere on Electrical Performance and Stability of High-Mobility Indium-Gallium-Tin Oxide Thin-Film Transistors
- Jeong, Hwan-Seok ;
- Cha, Hyun Seok ;
- Hwang, Seong Hyun ;
- Kwon, Hyuck-In
- 2020-11
- ELECTRONICS
- MDPI