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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 172건 중 121번부터 130번까지의 결과를 표시합니다.
2015
Article
Asymmetrical degradation behaviors in amorphous InGaZnO thin-film transistors under various gate and drain bias stresses
- Lee, Daeun ;
- Jeong, Chan-Yong ;
- Song, Sang-Hun ;
- Jin Xiao-Shi ;
- Kim, Jong In ;
- ... Kwon, Hyuck-In ;
- 외 1명
- 2015-01
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
- A V S AMER INST PHYSICS
2014
Article
Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer
- Han, Young-Joon ;
- Choi, Yong-Jin ;
- Cho, In-Tak ;
- Jin, Sung Hun ;
- Lee, Jong-Ho ;
- ... Kwon, Hyuck-In
- 2014-12
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
High Performance p-type SnO thin-film Transistor with SiOx Gate Insulator Deposited by Low-Temperature PECVD Method
- Myeonghun, U. ;
- Han, Young-Joon ;
- Song, Sang-Hun ;
- Cho, In-Tak ;
- Lee, Jong-Ho ;
- ... Kwon, Hyuck-In
- 2014-10
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
Effects of the active layers deposition temperature on the electrical performance of p-type SnO thin-film Transistors
- U, Myeonghun ;
- Kwon, Hyuck-In ;
- Cho, In-Tak ;
- Jin, Sung Hun ;
- Lee, Jong-Ho
- 2014-08
- Journal of the Korean Physical Society
- KOREAN PHYSICAL SOC
Article
Investigation of Buffer Traps in AlGaN/GaN Heterostructure Field-Effect Transistors Using a Simple Test Structure
- Jang, Seung Yup ;
- Shin, Jong-Hoon ;
- Hwang, Eu Jin ;
- Choi, Hyo-Seung ;
- Jeong, Hun ;
- ... Song, Sang-Hun ;
- ... Kwon, Hyuck-In
- 2014-08
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
Thermoreflectance microscopy analysis on self-heating effect of short-channel amorphous In-Ga-Zn-O thin film transistors
- Kim, Jong In ;
- Chang, Ki Soo ;
- Kim, Dong Uk ;
- Cho, In-Tak ;
- Jeong, Chan-Yong ;
- ... Kwon, Hyuck-In ;
- 외 3명
- 2014-07
- Applied Physics Letters
- AMER INST PHYSICS
Article
Effects of air-annealing on the electrical properties of p-type tin monoxide thin-film transistors
- Cho, In-Tak ;
- Myeonghun, U. ;
- Song, Sang-Hun ;
- Lee, Jong-Ho ;
- Kwon, Hyuck-In
- 2014-04
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
Article
A study on the degradation mechanism of InGaZnO thin-film transistors under simultaneous gate and drain bias stresses based on the electronic trap characterization
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- Song, Sang-Hun ;
- Kim, Jong In ;
- Lee, Jong-Ho ;
- ... Kwon, Hyuck-In
- 2014-04
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
Article
Effect of Temperature and Electric Field on Degradation in Amorphous InGaZnO TFTs Under Positive Gate and Drain Bias Stress
- Kim, Jong In ;
- Cho, In-Tak ;
- Joe, Sung-Min ;
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- ... Kwon, Hyuck-In ;
- 외 2명
- 2014-04
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors
- Park, Jae Chul ;
- Cho, In-Tak ;
- Cho, Eou-Sik ;
- Kim, Dae Hwan ;
- Jeong, Chan-Yong ;
- ... Kwon, Hyuck-In
- 2014-02
- Journal of Nanoelectronics and Optoelectronics
- AMER SCIENTIFIC PUBLISHERS