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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 172건 중 111번부터 120번까지의 결과를 표시합니다.
2015
Article
Investigation of Intrinsic Electrical Characteristics and Contact Effects in p-Type Tin Monoxide Thin-Film Transistors Using Gated-Four-Probe Measurements
- Han, Young-Joon ;
- Choi, Yong-Jin ;
- Jeong, Hoon ;
- Kwon, Hyuck-In
- 2015-10
- Journal of Nanoscience and Nanotechnology
- AMER SCIENTIFIC PUBLISHERS
Article
Design and Analysis of Gate-recessed AlGaN/GaN Fin-type Field-Effect Transistor
- Jang, Young In ;
- Seo, Jae Hwa ;
- Yoon, Young Jun ;
- Eun, Hye Rim ;
- Kwon, Ra Hee ;
- ... Kwon, Hyuck-In ;
- 외 2명
- 2015-10
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
A novel high performance junctionless FETs with saddle-gate
- Jin, Xiaoshi ;
- Wu, Meile ;
- Liu, Xi ;
- Chuai, Rongyan ;
- Kwon, Hyuck-In ;
- 외 2명
- 2015-09
- Journal of Computational Electronics
- SPRINGER
Article
Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- Han, Young-Joon ;
- Choi, Yong-Jin ;
- Kwon, Hyuck-In
- 2015-08
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
Article
Enhancement mode p-channel SnO thin-film transistors with dual-gate structures
- Choi, Yong-Jin ;
- Han, Young-Joon ;
- Jeong, Chan-Yong ;
- Song, Sang-Hun ;
- Baek, Geun Woo ;
- ... Kwon, Hyuck-In ;
- 외 1명
- 2015-07
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
- A V S AMER INST PHYSICS
Article
Investigation of Electrical Performance Degradation in p-AlGaN Gate Heterostructure Field-Effect Transistors Under Various Off-Stress Conditions
- Choi, Hyo-Seung ;
- Jeong, Hun ;
- Lee, Jeong-Hwan ;
- Kwon, Hyuck-In
- 2015-06
- Journal of Nanoelectronics and Optoelectronics
- AMER SCIENTIFIC PUBLISHERS
Article
Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress
- Kim, Jong In ;
- Cho, In-Tak ;
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- Kwon, Hyuck-In ;
- 외 6명
- 2015-06
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Properties of bottom and top channel interfaces in double-gate back-channel-etched amorphous indium-gallium-zinc oxide thin-film transistors
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- Song, Sang-Hun ;
- Kim, Jong In ;
- Lee, Jong-Ho ;
- ... Kwon, Hyuck-In ;
- 외 2명
- 2015-05
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
- A V S AMER INST PHYSICS
Article
Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors
- Han, Young-Joon ;
- Choi, Yong-Jin ;
- Jeong, Chan-Yong ;
- Lee, Daeun ;
- Song, Sang-Hun ;
- ... Kwon, Hyuck-In
- 2015-05
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Displacement sensitivity comparison between the first two symmetrical in-plane modes of a tuning fork crystal oscillator by using an optical chopping method
- Choi, Hyo-Seung ;
- Myeonghun, U. ;
- Jeong, Chan-Yong ;
- Kwon, Hyuck-In ;
- Song, Sang-Hun
- 2015-03
- Journal of the Korean Physical Society
- KOREAN PHYSICAL SOC