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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 172건 중 81번부터 90번까지의 결과를 표시합니다.
2017
Article
Demonstration of high-performance p-type tin oxide thin-film transistors using argon-plasma surface treatments
- Bae, Sang-Dae ;
- Kwon, Soo-Hun ;
- Jeong, Hwan-Seok ;
- Kwon, Hyuck-In
- 2017-07
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
Article
Large Size of Capacitive Window-Unified TSP Using by Contact Hole Type as an Insulator
- Seo, Woo-Hyung ;
- Hong, Chan-Hwa ;
- Yang, Ji-Woong ;
- Na, Yun-Been ;
- Kwon, Hyuck-In ;
- 외 1명
- 2017-05
- Journal of Nanoscience and Nanotechnology
- AMER SCIENTIFIC PUBLISHERS
Article
Low temperature carrier transport mechanism in high-mobility zinc oxynitride thin-film transistors
- Kim, Hee-Joong ;
- Hong, Sae-Young ;
- Kim, Dae-Hwan ;
- Jeong, Hwan-Seok ;
- Kwon, Hyuck-In
- 2017-05
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
- A V S AMER INST PHYSICS
Article
Effects of Er-Doping on Amorphous InZnSnO/InZnSnO: Er Double-Channel Thin-Film Transistors
- Yang, Ji-Woong ;
- Na, Yun-Been ;
- Shin, Jae-Heon ;
- Hong, Chan-Hwa ;
- Seo, Woo-Hyung ;
- ... Song, Sang-Hun ;
- ... Kwon, Hyuck-In ;
- 외 3명
- 2017-05
- Journal of Nanoscience and Nanotechnology
- AMER SCIENTIFIC PUBLISHERS
Article
Charge Transport Mechanism in p-Channel Tin Monoxide Thin-Film Transistors
- Kim, Hee-Joong ;
- Jeong, Chan-Yong ;
- Bae, Sang-Dae ;
- Lee, Jeong-Hwan ;
- Kwon, Hyuck-In
- 2017-04
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Editorial
- Kwon, Hyuck-In ;
- Cha, Ho-Young ;
- Choi, Woo Young ;
- Yoon, Sung-Min
- 2017-04
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
Experimental Investigation of Physical Mechanism for Asymmetrical Degradation in Amorphous InGaZnO Thin-film Transistors under Simultaneous Gate and Drain Bias Stresses
- Jeong, Chan-Yong ;
- Kim, Hee-Joong ;
- Lee, Jeong-Hwan ;
- Kwon, Hyuck-In
- 2017-04
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
Determination of Interface and Bulk Trap Densities in High-Mobility p-type WSe2 Thin-Film Transistors
- Kim, Hee-Joong ;
- Kim, Dae-Hwan ;
- Jeong, Chan-Yong ;
- Lee, Jeong-Hwan ;
- Kwon, Hyuck-In
- 2017-04
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Electrical instability of high-mobility zinc oxynitride thin-film transistors upon water exposure
- Kim, Dae-Hwan ;
- Jeong, Hwan-Seok ;
- Kwon, Hyuck-In
- 2017-03
- Nanotechnology
- IOP PUBLISHING LTD
Article
Modeling of asymmetric degradation based on a non-uniform electric field and temperature in amorphous In-Ga-Zn-O thin film transistors
- Kim, Jong In ;
- Jeong, Chan-Yong ;
- Kwon, Hyuck-In ;
- Jung, Keum Dong ;
- Park, Mun Soo ;
- 외 3명
- 2017-03
- Semiconductor Science and Technology
- IOP PUBLISHING LTD