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자료 필터
자료유형
발행연도
2008 ~ 2026
2008 2026
키워드
언어
전체 172건 중 161번부터 170번까지의 결과를 표시합니다.
2010
Article
A full analytical model of fringing-field-induced parasitic capacitance for nano-scaled MOSFETs
- Liu, Xi ;
- Jin, Xiaoshi ;
- Lee, Jung-Hee ;
- Zhu, Lei ;
- Kwon, Hyuck-In ;
- 외 1명
- 2010-01
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
2009
Article
Full-Swing InGaZnO Thin Film Transistor Inverter with Depletion Load
- Lee, Jeong-Min ;
- Cho, In-Tak ;
- Lee, Jong-Ho ;
- Kwon, Hyuck-In
- 2009-10
- Japanese Journal of Applied Physics
- JAPAN SOC APPLIED PHYSICS
Article
Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With Al2O3 and Al2O3/SiNx Gate Dielectrics
- Cho, In-Tak ;
- Cheong, Woo-Seok ;
- Hwang, Chi-Sun ;
- Lee, Jeong-Min ;
- Kwon, Hyuck-In ;
- 외 1명
- 2009-08
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
The 1/f Noise and Random Telegraph Noise Characteristics in Floating-Gate NAND Flash Memories
- Bae, Sung-Ho ;
- Lee, Jeong-Hyun ;
- Kwon, Hyuck-In ;
- Ahn, Jung-Ryul ;
- Om, Jae-Chul ;
- 외 2명
- 2009-08
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Current Model of Fully Depleted Nanoscale Surrounding-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with Doped Channel in All Operation Regions
- Choi, Byung-Kil ;
- Jeong, Min-Kyu ;
- Cho, Il Hwan ;
- Kwon, Hyuck-In ;
- Lee, Jong-Ho
- 2009-08
- Japanese Journal of Applied Physics
- IOP PUBLISHING LTD
Article
Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics
- Lee, Jeong-Min ;
- Cho, In-Tak ;
- Lee, Jong-Ho ;
- Cheong, Woo-Seok ;
- Hwang, Chi-Sun ;
- ... Kwon, Hyuck-In
- 2009-06
- Applied Physics Letters
- AMER INST PHYSICS
Article
Threshold Voltage Modeling of Fully Depleted Nanoscale Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with Doped Channel by Considering Drain Bias
- Choi, Byung-Kil ;
- Kwon, Hyuck-In ;
- Cho, Il Hwan ;
- Lee, Jong-Ho
- 2009-05
- Japanese Journal of Applied Physics
- IOP PUBLISHING LTD
Article
Low-Frequency Noise in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors
- Lee, Jeong-Min ;
- Cheong, Woo-Seok ;
- Hwang, Chi-Sun ;
- Cho, In-Tak ;
- Kwon, Hyuck-In ;
- 외 1명
- 2009-05
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses
- Cho, In-Tak ;
- Lee, Jeong-Min ;
- Lee, Jong-Ho ;
- Kwon, Hyuck-In
- 2009-01
- Semiconductor Science and Technology
- IOP PUBLISHING LTD
2008
Article
Compact Current Modeling of Fully Depleted Symmetric Double-Gate Metal-Oxide-Semiconductor Field Effect Transistors with Doped Short-Channel
- Choi, Bvung-Kil ;
- Jeong, Min-Kyu ;
- Kwon, Hyuck-In ;
- Shin, Hyungcheol ;
- Lee, Jong-Ho
- 2008-11
- Japanese Journal of Applied Physics
- IOP PUBLISHING LTD